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Minimal area test points for deterministic patterns.

, , , , , и . ITC, стр. 1-7. IEEE, (2016)

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Janusz Panzer

Janusz Rat

Janusz Gatniejewski

Janusz Bogdanowicz

Janusz Surzykiewicz

 

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On Linear Dependencies in Subspaces of LFSR-Generated Sequences., и . IEEE Trans. Computers, 45 (10): 1212-1216 (1996)Built-In Self-Test for Systems on Silicon., , и . VLSI Design, стр. 609-610. IEEE Computer Society, (1999)High Performance Dense Ring Generators., , , и . IEEE Trans. Computers, 55 (1): 83-87 (2006)Embedded deterministic test points for compact cell-aware tests., , , , , , , , , и . ITC, стр. 1-8. IEEE, (2015)Self-test methodology for at-speed test of crosstalk in chip interconnects., , и . DAC, стр. 619-624. ACM, (2000)On Using Implied Values in EDT-based Test Compression., , , , и . DAC, стр. 11:1-11:6. ACM, (2014)EDT Bandwidth Management in SoC Designs., , , , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 31 (12): 1894-1907 (2012)Embedded deterministic test., , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 23 (5): 776-792 (2004)Hardware Protection via Logic Locking Test Points., , , , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 37 (12): 3020-3030 (2018)Ring generators - new devices for embedded test applications., , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 23 (9): 1306-1320 (2004)