Author of the publication

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Study of breakdown in STT-MRAM using ramped voltage stress and all-in-one maximum likelihood fit., , , , , , and . ESSDERC, page 146-149. IEEE, (2018)Wafer-Level Aging of InGaAs/GaAs Nano-Ridge p-i-n Diodes Monolithically Integrated on Silicon., , , , , , , , , and . IRPS, page 9. IEEE, (2022)The Mysterious Bipolar Bias Temperature Stress from the Perspective of Gate-Sided Hydrogen Release., , , , , and . IRPS, page 1-6. IEEE, (2020)Trap-polarization interaction during low-field trap characterization on hafnia-based ferroelectric gatestacks., , , , , , , , , and . IRPS, page 12-1. IEEE, (2022)Extended RVS characterisation of STT-MRAM devices: Enabling detection of AP/P switching and breakdown., , , , , , , , , and 1 other author(s). IRPS, page 5-1. IEEE, (2018)Gate-Stack Engineered NBTI Improvements in Highvoltage Logic-For-Memory High-ĸ/Metal Gate Devices., , , , , , , , , and 6 other author(s). IRPS, page 1-8. IEEE, (2019)Modeling Dark Current Degradation of Monolithic InGaAs/GaAs-On-Si Nano-Ridge Photodetectors., , , , , , , and . IRPS, page 2. IEEE, (2024)DC Reliability Study of $high-\kappa$ GaN-on-Si MOS-HEMT's for mm-Wave Power Amplifiers., , , , , , , , , and 1 other author(s). IRPS, page 1-9. IEEE, (2024)Accelerated Device Degradation of High-Speed Ge Waveguide Photodetectors., , , , and . IRPS, page 1-7. IEEE, (2019)Understanding and empirical fitting the breakdown of MgO in end-of-line annealed MTJs., , , , , and . IRPS, page 1-5. IEEE, (2020)