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Investigation on NBTI-induced dynamic variability in nanoscale CMOS devices: Modeling, experimental evidence, and impact on circuits.

S. Guo, R. Wang, P. Ren, C. Liu, M. Luo, X. Jiang, Y. Wang, and R. Huang. Microelectron. Reliab., (2018)

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Shaofeng Kuang

Shaofeng Liu

Jiong Guo

Guo Cheng

Xinrong Guo

Other publications of authors with the same name

OMI/TMI-based Modeling and Fast Simulation of Random Telegraph Noise (RTN) in Advanced Logic Devices and Circuits.R. Wang, Z. Zhang, S. Guo, Q. Wang, D. Wu, J. Wang, and R. Huang. ASICON, page 1-4. IEEE, (2019)Evaluation of SRAM Vmin shift induced by random telegraph noise (RTN): physical understanding and prediction method.S. Guo, Z. Lin, R. Wang, D. Mao, Y. Wang, and R. Huang. ISCAS, page 1-4. IEEE, (2018)Layout-dependent aging mitigation for critical path timing.C. Hsu, S. Guo, Y. Lin, X. Xu, M. Li, R. Wang, R. Huang, and D. Pan. ASP-DAC, page 153-158. IEEE, (2018)Towards reliability-aware circuit design in nanoscale FinFET technology: - New-generation aging model and circuit reliability simulator.S. Guo, R. Wang, Z. Yu, P. Hao, P. Ren, Y. Wang, S. Liao, C. Huang, T. Guo, A. Chen and 2 other author(s). ICCAD, page 780-785. IEEE, (2017)Investigation on NBTI-induced dynamic variability in nanoscale CMOS devices: Modeling, experimental evidence, and impact on circuits.S. Guo, R. Wang, P. Ren, C. Liu, M. Luo, X. Jiang, Y. Wang, and R. Huang. Microelectron. Reliab., (2018)How close to the CMOS voltage scaling limit for FinFET technology? - Near-threshold computing and stochastic computing.R. Wang, X. Jiang, S. Guo, and R. Huang. ASICON, page 56-59. IEEE, (2017)Circuit Reliability Comparison Between Stochastic Computing and Binary Computing.Z. Zhang, R. Wang, Z. Zhang, Y. Zhang, S. Guo, and R. Huang. IEEE Trans. Circuits Syst., 67-II (12): 3342-3346 (2020)Investigation on the amplitude coupling effect of random telegraph noise (RTN) in nanoscale FinFETs.S. Guo, Z. Lin, R. Wang, Z. Zhang, Z. Zhang, Y. Wang, and R. Huang. IRPS, page 6-1. IEEE, (2018)

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Disambiguation of "Guo, Shaofeng"

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Investigation on NBTI-induced dynamic variability in nanoscale CMOS devices: Modeling, experimental evidence, and impact on circuits.

Please choose a person to relate this publication to

Shaofeng Kuang

Shaofeng Liu

Jiong Guo

Guo Cheng

Xinrong Guo

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Guo, Shaofeng"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Investigation on NBTI-induced dynamic variability in nanoscale CMOS devices: Modeling, experimental evidence, and impact on circuits.

Please choose a person to relate this publication to

Shaofeng Kuang

Shaofeng Liu

Jiong Guo

Guo Cheng

Xinrong Guo

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
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history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Investigation on NBTI-induced dynamic variability in nanoscale CMOS devices: Modeling, experimental evidence, and impact on circuits.