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Investigation on NBTI-induced dynamic variability in nanoscale CMOS devices: Modeling, experimental evidence, and impact on circuits.

S. Guo, R. Wang, P. Ren, C. Liu, M. Luo, X. Jiang, Y. Wang, and R. Huang. Microelectron. Reliab., (2018)

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Liu Liu

Lu Liu

Lei Liu

Other publications of authors with the same name

New insights into the HCI degradation of pass-gate transistor in advanced FinFET technology.P. Ren, C. Liu, S. Wan, J. Zhang, Z. Yu, N. Liu, Y. Sun, R. Wang, C. Zhan, Z. Gan and 3 other author(s). IRPS, page 3-1. IEEE, (2018)Performance Trade-Off Scenarios for GAA Nanosheet FETs Considering Inner-spacers and Epi-induced Stress: Understanding & Mitigating Process Risks.A. Rawat, K. Bhuwalka, P. Matagne, B. Vermeersch, H. Wu, G. Hellings, J. Ryckaert, and C. Liu. ESSCIRC, page 55-58. IEEE, (2021)Investigation on NBTI-induced dynamic variability in nanoscale CMOS devices: Modeling, experimental evidence, and impact on circuits.S. Guo, R. Wang, P. Ren, C. Liu, M. Luo, X. Jiang, Y. Wang, and R. Huang. Microelectron. Reliab., (2018)Deep H-GCN: Fast Analog IC Aging-Induced Degradation Estimation.T. Chen, Q. Sun, C. Zhan, C. Liu, H. Yu, and B. Yu. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 41 (7): 1990-2003 (2022)Analog IC Aging-induced Degradation Estimation via Heterogeneous Graph Convolutional Networks.T. Chen, Q. Sun, C. Zhan, C. Liu, H. Yu, and B. Yu. ASP-DAC, page 898-903. ACM, (2021)HCI and NBTI induced degradation in gate-all-around silicon nanowire transistors.R. Huang, R. Wang, C. Liu, L. Zhang, J. Zhuge, Y. Tao, J. Zou, Y. Liu, and Y. Wang. Microelectron. Reliab., 51 (9-11): 1515-1520 (2011)Systematical study of 14nm FinFET reliability: From device level stress to product HTOL.C. Liu, H. Sagong, H. Kim, S. Choo, H. Lee, Y. Kim, H. Kim, B. Jo, M. Jin, J. Kim and 3 other author(s). IRPS, page 2. IEEE, (2015)

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Disambiguation of "Liu, Changze"

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Investigation on NBTI-induced dynamic variability in nanoscale CMOS devices: Modeling, experimental evidence, and impact on circuits.

Please choose a person to relate this publication to

Liu Liu

Liu Liu

Liu Liu

Lu Liu

Lei Liu

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Liu, Changze"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Investigation on NBTI-induced dynamic variability in nanoscale CMOS devices: Modeling, experimental evidence, and impact on circuits.

Please choose a person to relate this publication to

Liu Liu

Liu Liu

Liu Liu

Lu Liu

Lei Liu

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
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APA
Chicago
DIN 1505
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Investigation on NBTI-induced dynamic variability in nanoscale CMOS devices: Modeling, experimental evidence, and impact on circuits.