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Investigation on NBTI-induced dynamic variability in nanoscale CMOS devices: Modeling, experimental evidence, and impact on circuits.

S. Guo, R. Wang, P. Ren, C. Liu, M. Luo, X. Jiang, Y. Wang, and R. Huang. Microelectron. Reliab., (2018)

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Wang Wang

Linfang Wang

Investigation of the functions of 53BP1 in DNA demethylationL. Wang. Uni Marburg, (2009)

Paul Wang

Lien Wang

Scheifoo Wang

Other publications of authors with the same name

Highly Reconfigurable Analog Baseband for Multistandard Wireless Receivers in 65-nm CMOS.Y. Wang, L. Ye, H. Liao, R. Huang, and Y. Wang. IEEE Trans. Circuits Syst. II Express Briefs, 62-II (3): 296-300 (2015)A low power and small area all digital delay-locked loop based on ring oscillator architecture.J. Zheng, W. Li, X. Lu, Y. Cheng, and Y. Wang. Sci. China Inf. Sci., 55 (2): 453-460 (2012)A comb-gate silicon tunneling field effect transistor with improved on-state current.Z. Zhan, Q. Huang, R. Huang, W. Jiang, and Y. Wang. Sci. China Inf. Sci., 56 (7): 1-6 (2013)HCI and NBTI induced degradation in gate-all-around silicon nanowire transistors.R. Huang, R. Wang, C. Liu, L. Zhang, J. Zhuge, Y. Tao, J. Zou, Y. Liu, and Y. Wang. Microelectron. Reliab., 51 (9-11): 1515-1520 (2011)A 148-nW Reconfigurable Event-Driven Intelligent Wake-Up System for AIoT Nodes Using an Asynchronous Pulse-Based Feature Extractor and a Convolutional Neural Network.Z. Wang, Y. Liu, P. Zhou, Z. Tan, H. Fan, Y. Zhang, L. Shen, J. Ru, Y. Wang, L. Ye and 1 other author(s). IEEE J. Solid State Circuits, 56 (11): 3274-3288 (2021)The Challenges and Emerging Technologies for Low-Power Artificial Intelligence IoT Systems.L. Ye, Z. Wang, Y. Liu, P. Chen, H. Li, H. Zhang, M. Wu, W. He, L. Shen, Y. Zhang and 3 other author(s). IEEE Trans. Circuits Syst. I Regul. Pap., 68 (12): 4821-4834 (2021)Re-Assessment of Steep-Slope Device Design From a Circuit-Level Perspective Using Novel Evaluation Criteria and Model-Less Method.Z. Wang, L. Ye, Q. Huang, Y. Wang, and R. Huang. IEEE Trans. Circuits Syst. I Regul. Pap., 68 (4): 1624-1635 (2021)Novel devices and process for 32 nm CMOS technology and beyond.Y. Wang, X. Zhang, X. Liu, and R. Huang. Sci. China Ser. F Inf. Sci., 51 (6): 743-755 (2008)High temperature induced failure in Ti/Al/Ni/Au Ohmic contacts on AlGaN/GaN heterostructure.Z. Dong, J. Wang, C. Wen, S. Liu, R. Gong, M. Yu, Y. Hao, F. Xu, B. Shen, and Y. Wang. Microelectron. Reliab., 52 (2): 434-438 (2012)Physical understanding and optimization of resistive switching characteristics in oxide-RRAM.J. Kang, P. Huang, Z. Chen, Y. Zhao, C. Liu, R. Han, L. Liu, X. Liu, Y. Wang, and B. Gao. ESSDERC, page 154-159. IEEE, (2016)

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Disambiguation of "Wang, Yangyuan"

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Investigation on NBTI-induced dynamic variability in nanoscale CMOS devices: Modeling, experimental evidence, and impact on circuits.

Please choose a person to relate this publication to

Wang Wang

Linfang Wang

Paul Wang

Lien Wang

Scheifoo Wang

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Wang, Yangyuan"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Investigation on NBTI-induced dynamic variability in nanoscale CMOS devices: Modeling, experimental evidence, and impact on circuits.

Please choose a person to relate this publication to

Wang Wang

Linfang Wang

Paul Wang

Lien Wang

Scheifoo Wang

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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Investigation on NBTI-induced dynamic variability in nanoscale CMOS devices: Modeling, experimental evidence, and impact on circuits.