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Surface Layer Analysis of a 28Si-Enriched Sphere Both in Vacuum and in Air by Ellipsometry.

, , , , and . IEEE Trans. Instrumentation and Measurement, 66 (6): 1283-1288 (2017)

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Surface Layer Analysis of a 28Si-Enriched Sphere Both in Vacuum and in Air by Ellipsometry., , , , and . IEEE Trans. Instrumentation and Measurement, 66 (6): 1283-1288 (2017)Density Determination of Silicon Spheres Using an Interferometer With Optical Frequency Tuning., , , , and . IEEE Trans. Instrumentation and Measurement, 56 (2): 476-480 (2007)Improvements to the Volume Measurement of 28Si Spheres to Determine the Avogadro Constant., , , , and . IEEE Trans. Instrumentation and Measurement, 64 (6): 1650-1656 (2015)Thickness Measurement of Oxide and Carbonaceous Layers on a 28Si Sphere by XPS., , , , and . IEEE Trans. Instrumentation and Measurement, 66 (6): 1297-1303 (2017)Reproducibility of the Realization of the Kilogram Based on the Planck Constant by the XRCD Method at NMIJ., , , , , , , , , and . IEEE Trans. Instrum. Meas., (2021)Realization of the Kilogram Based on the Planck Constant at NMIJ., , , , , , and . IEEE Trans. Instrumentation and Measurement, 66 (6): 1267-1274 (2017)Investigating Stability of Si Sphere Surface Layer in Ambient-Vacuum Cyclic Measurements Using Ellipsometry., , , , , and . IEEE Trans. Instrum. Meas., (2022)Surface Layer Analysis of Si Sphere by XRF and XPS., , , , and . IEEE Trans. Instrumentation and Measurement, 64 (6): 1509-1513 (2015)