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Reproducibility of the Realization of the Kilogram Based on the Planck Constant by the XRCD Method at NMIJ.

, , , , , , , , , and . IEEE Trans. Instrum. Meas., (2021)

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Diameter Comparison of a Silicon Sphere for the International Avogadro Coordination Project., , , , , , and . IEEE Trans. Instrumentation and Measurement, 60 (7): 2615-2620 (2011)Investigating Stability of Si Sphere Surface Layer in Ambient-Vacuum Cyclic Measurements Using Ellipsometry., , , , , and . IEEE Trans. Instrum. Meas., (2022)Finite-Element Simulation of Effect of Surface Roughness of Coaxial Cylindrical Electrodes on Small Mass and Force Measurements Using Voltage Balance Apparatus., and . IEEE Trans. Instrum. Meas., (2022)Surface Layer Analysis of Si Sphere by XRF and XPS., , , , and . IEEE Trans. Instrumentation and Measurement, 64 (6): 1509-1513 (2015)Homogeneity Characterization of Lattice Spacing of Silicon Single Crystals., , , , and . IEEE Trans. Instrumentation and Measurement, 64 (6): 1692-1695 (2015)Interferometric determination of the diameter of a silicon sphere using a direct optical frequency tuning system., and . IEEE Trans. Instrumentation and Measurement, 52 (2): 631-635 (2003)Mass Measurement of 1-kg Silicon Spheres for Determination of the Avogadro and Planck Constants., , , and . IEEE Trans. Instrumentation and Measurement, 64 (6): 1527-1532 (2015)Surface Layer Analysis of a 28Si-Enriched Sphere Both in Vacuum and in Air by Ellipsometry., , , , and . IEEE Trans. Instrumentation and Measurement, 66 (6): 1283-1288 (2017)Density Determination of Silicon Spheres Using an Interferometer With Optical Frequency Tuning., , , , and . IEEE Trans. Instrumentation and Measurement, 56 (2): 476-480 (2007)Volume Measurement of a 28Si-Enriched Sphere for a Determination of the Avogadro Constant at NMIJ., , , , , and . IEEE Trans. Instrumentation and Measurement, 68 (6): 1913-1920 (2019)