( en | de | ru )

 

Disambiguation of "Krenz-Baath, Rene"

Author of the publication

copydeleteadd this publication to your clipboard
BASTION: Board and SoC test instrumentation for ageing and no failure found.

, , , , , , , , and . DATE, page 115-120. IEEE, (2017)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Rolf Baath

Albrecht Baath

Christian-Wilhelm Baath

Ekkehart Renesse

Horst Renemann

 

Other publications of authors with the same name

Defect-oriented cell-internal testing., , , , , , , and . ITC, page 285-294. IEEE Computer Society, (2010)Robust Evaluation of Weighted Random Logic BIST Structures in Industrial Designs., , , , , and . DSD, page 823-829. IEEE Computer Society, (2012)Verifying Bio-Electronic Systems., , and . DDECS, page 161-166. IEEE, (2023)Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs., , , , , , , and . ITC, page 1-10. IEEE Computer Society, (2009)Upper-bound computation for optimal retargeting in IEEE1687 networks., , and . ITC, page 1-10. IEEE, (2016)BASTION: Board and SoC test instrumentation for ageing and no failure found., , , , , , , , and . DATE, page 115-120. IEEE, (2017)A suite of IEEE 1687 benchmark networks., , , , , , , , and . ITC, page 1-10. IEEE, (2016)Design, Verification, and Application of IEEE 1687., , , , and . ATS, page 93-100. IEEE Computer Society, (2014)Access time minimization in IEEE 1687 networks., , and . ITC, page 1-10. IEEE, (2015)Fault collapsing of multi-conditional faults., , and . DDECS, page 42-47. IEEE Computer Society, (2013)