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Novel Speed-and-Power-Optimized SRAM Cell Designs With Enhanced Self-Recoverability From Single- and Double-Node Upsets.

, , , , , , , and . IEEE Trans. Circuits Syst., 67-I (12): 4684-4695 (2020)

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Design of a Triple-Node-Upset Self-Recoverable Latch for Aerospace Applications in Harsh Radiation Environments., , , , , , , and . IEEE Trans. Aerosp. Electron. Syst., 56 (2): 1163-1171 (2020)Novel Speed-and-Power-Optimized SRAM Cell Designs With Enhanced Self-Recoverability From Single- and Double-Node Upsets., , , , , , , and . IEEE Trans. Circuits Syst., 67-I (12): 4684-4695 (2020)Design of a Highly Reliable SRAM Cell with Advanced Self-Recoverability from Soft Errors., , , , , , , , and . ITC-Asia, page 35-40. IEEE, (2020)Design of a Sextuple Cross-Coupled SRAM Cell with Optimized Access Operations for Highly Reliable Terrestrial Applications., , , , , , , and . ATS, page 55-60. IEEE, (2019)Novel Quadruple Cross-Coupled Memory Cell Designs With Protection Against Single Event Upsets and Double-Node Upsets., , , , , , and . IEEE Access, (2019)Single-Event Double-Upset Self-Recoverable and Single-Event Transient Pulse Filterable Latch Design for Low Power Applications., , , and . DATE, page 1679-1684. IEEE, (2019)Information Assurance Through Redundant Design: A Novel TNU Error-Resilient Latch for Harsh Radiation Environment., , , , , , , and . IEEE Trans. Computers, 69 (6): 789-799 (2020)Design of a Novel Self-Recoverable SRAM Cell Protected Against Soft Errors., , , , , and . DSA, page 497-498. IEEE, (2019)On the channel estimation of low-PAPR waveform for 5G Evolution and 6G., , , , and . VTC Fall, page 1-5. IEEE, (2023)On the Design of Offset Spatial Modulation with Low PAPR., , , and . VTC Spring, page 1-6. IEEE, (2022)