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New Test Methodology for Resistive Open Defect Detection in Memory Address Decoders., and . VTS, page 123-128. IEEE Computer Society, (2004)Memory Testing Under Different Stress Conditions: An Industrial Evaluation., , , , , and . DATE, page 438-443. IEEE Computer Society, (2005)Memory Testing Under Different Stress Conditions: An Industrial Evaluation, , , , , and . CoRR, (2007)A special march test to detect delay coupling faults for RAMs., and . ICECS, page 995-999. IEEE, (2001)Memory testing improvements through different stress conditions., , , , , and . ESSCIRC, page 299-302. IEEE, (2005)Reducing test cost for mixed signal circuits "From TOETS to ELESIS".. European Test Symposium, page 1. IEEE Computer Society, (2012)Word line pulsing technique for stability fault detection in SRAM cells., , , and . ITC, page 10. IEEE Computer Society, (2005)Test quality analysis and improvement for an embedded asynchronous FIFO., , , , , and . DATE, page 859-864. EDA Consortium, San Jose, CA, USA, (2007)Programmable techniques for cell stability test and debug in embedded SRAMs., , , and . CICC, page 443-446. IEEE, (2005)New short and efficient algorithm for testing random-access memories., and . ICECS, page 541-544. IEEE, (1998)