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s Write Throughput at Tj of 170°C.

Y. Taito, T. Kono, M. Nakano, T. Saito, T. Ito, K. Noguchi, H. Hidaka, and T. Yamauchi. IEEE J. Solid State Circuits, 51 (1): 213-221 (2016)

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Kaku Saito

Itohei Saito

Tomoya Wada

Mitsuhiro Saito

Naoki Saito

Other publications of authors with the same name

A 28 nm Embedded Split-Gate MONOS (SG-MONOS) Flash Macro for Automotive Achieving 6.4 GB/s Read Throughput by 200 MHz No-Wait Read Operation and 2.0 MB/s Write Throughput at Tj of 170°C.Y. Taito, T. Kono, M. Nakano, T. Saito, T. Ito, K. Noguchi, H. Hidaka, and T. Yamauchi. IEEE J. Solid State Circuits, 51 (1): 213-221 (2016)Effect of imbalance in activities between ON- and OFF-center LGN cells on orientation map formation.H. Nakagama, T. Saito, and S. Tanaka. Biol. Cybern., 83 (2): 85-92 (2000)Overview of Embedded Flash Memory Technology.T. Kono, T. Saito, and T. Yamauchi. Embedded Flash Memory for Embedded Systems, Springer, (2018)Algorithms for Finding a Minimum Repetition Representation of a String.A. Nakamura, T. Saito, I. Takigawa, H. Mamitsuka, and M. Kudo. SPIRE, volume 6393 of Lecture Notes in Computer Science, page 185-190. Springer, (2010)A 22nm 32Mb Embedded STT-MRAM Macro Achieving 5.9ns Random Read Access and 5.8MB/s Write Throughput at up to Tj of 150 °C.T. Shimoi, K. Matsubara, T. Saito, T. Ogawa, Y. Taito, Y. Kaneda, M. Izuna, K. Takeda, H. Mitani, T. Ito and 1 other author(s). VLSI Technology and Circuits, page 134-135. IEEE, (2022)Fast algorithms for finding a minimum repetition representation of strings and trees.A. Nakamura, T. Saito, I. Takigawa, M. Kudo, and H. Mamitsuka. Discret. Appl. Math., 161 (10-11): 1556-1575 (2013)15.8 A 22nm 10.8Mb Embedded STT-MRAM Macro Achieving over 200MHz Random-Read Access and a 10.4MB/s Write Throughput with an In-Field Programmable 0.3Mb MTJ-OTP for High-End MCUs.T. Ogawa, K. Matsubara, Y. Taito, T. Saito, M. Izuna, K. Takeda, Y. Kaneda, T. Shimoi, H. Mitani, T. Ito and 1 other author(s). ISSCC, page 290-292. IEEE, (2024)A 22-nm 32-Mb Embedded STT-MRAM Macro Achieving 5.9-ns Random Read Access and 7.4-MB/s Write Throughput at up to 150 °C.T. Shimoi, K. Matsubara, T. Saito, T. Ogawa, Y. Taito, Y. Kaneda, M. Izuna, K. Takeda, H. Mitani, T. Ito and 1 other author(s). IEEE J. Solid State Circuits, 59 (4): 1283-1292 (April 2024)Flexible Framework for Time-Series Pattern Matching over Multi-dimension Data Stream.T. Kida, T. Saito, and H. Arimura. PAKDD Workshops, volume 5433 of Lecture Notes in Computer Science, page 1-12. Springer, (2008)

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Disambiguation of "Saito, Tomoya"