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NBTI product level reliability for a low-power SRAM technology.. Microelectron. Reliab., 47 (6): 873-879 (2007)Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems., , , , , , , and . DFT, page 1-6. IEEE, (2020)Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM., , , , , , and . DTIS, page 1-6. IEEE, (2020)Substrate Engineering to Improve Soft-Error-Rate Immunity for SRAM Technologies., , , , and . Microelectron. Reliab., 41 (9-10): 1319-1324 (2001)Single Event Upsets Under Proton, Thermal, and Fast Neutron Irradiation in Emerging Nonvolatile Memories., , , , , , , , , and . IEEE Access, (2022)Leakage Increase of Narrow and Short BCPMOS., , , and . ISQED, page 51-54. IEEE Computer Society, (2004)Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs., , , , , , , , , and 1 other author(s). J. Electron. Test., 37 (3): 329-343 (2021)Impact of DVS on Power Consumption and SEE Sensitivity of COTS Volatile SRAMs., , , , , and . LATS, page 1-6. IEEE, (2021)