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Disambiguation of "O'Sullivan, Barry J."

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Bias Temperature Instability (BTI) of High-Voltage Devices for Memory Periphery.

, , , , , , , , , , , , , , , , and . IRPS, page 1-6. IEEE, (2022)

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Jamie O'Sullivan

Molecular cooling and emissions in large scale simulations of protostellar jets. Uni Heidelberg, (2009)

Donal O'Sullivan

Ilse O'Sullivan

Donal O'Sullivan

Donal O'Sullivan

 

Other publications of authors with the same name

Study of breakdown in STT-MRAM using ramped voltage stress and all-in-one maximum likelihood fit., , , , , , and . ESSDERC, page 146-149. IEEE, (2018)Wafer-Level Aging of InGaAs/GaAs Nano-Ridge p-i-n Diodes Monolithically Integrated on Silicon., , , , , , , , , and . IRPS, page 9. IEEE, (2022)The Mysterious Bipolar Bias Temperature Stress from the Perspective of Gate-Sided Hydrogen Release., , , , , and . IRPS, page 1-6. IEEE, (2020)Trap-polarization interaction during low-field trap characterization on hafnia-based ferroelectric gatestacks., , , , , , , , , and . IRPS, page 12-1. IEEE, (2022)Extended RVS characterisation of STT-MRAM devices: Enabling detection of AP/P switching and breakdown., , , , , , , , , and 1 other author(s). IRPS, page 5-1. IEEE, (2018)Gate-Stack Engineered NBTI Improvements in Highvoltage Logic-For-Memory High-ĸ/Metal Gate Devices., , , , , , , , , and 6 other author(s). IRPS, page 1-8. IEEE, (2019)Accelerated Device Degradation of High-Speed Ge Waveguide Photodetectors., , , , and . IRPS, page 1-7. IEEE, (2019)STT-MRAM array performance improvement through optimization of Ion Beam Etch and MTJ for Last-Level Cache application., , , , , , , , , and 6 other author(s). IMW, page 1-4. IEEE, (2021)Edge-induced reliability & performance degradation in STT-MRAM: an etch engineering solution., , , , , , , , , and 3 other author(s). IRPS, page 1-5. IEEE, (2021)Understanding and empirical fitting the breakdown of MgO in end-of-line annealed MTJs., , , , , and . IRPS, page 1-5. IEEE, (2020)