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High speed IDDQ test and its testability for process variation.

, , , , and . Asian Test Symposium, page 344-349. IEEE Computer Society, (2000)

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Test Pattern for Supply Current Test of Open Defects by Applying Time-Variable Electric Field., , , , and . DFT, page 287-. IEEE Computer Society, (2001)High speed IDDQ test and its testability for process variation., , , , and . Asian Test Symposium, page 344-349. IEEE Computer Society, (2000)Fault Detection of Combinational Circuits Based on Supply Current., , , and . ITC, page 374-380. IEEE Computer Society, (1988)Identification and Frequency Estimation of Feedback Bridging Faults Generating Logical Oscillation in CMOS Circuits., , and . IEICE Trans. Inf. Syst., 87-D (3): 571-579 (2004)Identification of Feedback Bridging Faults with Oscillation., , and . Asian Test Symposium, page 25-. IEEE Computer Society, (1999)Practical Fault Coverage of Supply Current Tests for Bipolar ICs., , , and . DELTA, page 189-194. IEEE Computer Society, (2004)Test Time Reduction for I DDQ Testing by Arranging Test Vectors., , and . Asian Test Symposium, page 423-428. IEEE Computer Society, (2002)Sequential Machines Having Quasi-Stable States.. IEEE Trans. Computers, 29 (5): 405-408 (1980)I_DDQ Test Method Based on Wavelet Transformation for Noisy Current Measurement Environment., , , , , , and . Asian Test Symposium, page 112-117. IEEE Computer Society, (2004)A BIST Circuit for IDDQ Tests., , , , , and . Asian Test Symposium, page 390-395. IEEE Computer Society, (2003)