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Disambiguation of "Hashizume, Masaki"

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Test Pattern for Supply Current Test of Open Defects by Applying Time-Variable Electric Field.

, , , , and . DFT, page 287-. IEEE Computer Society, (2001)

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Keiko Hashizume

Masaki Nakajima

 

Other publications of authors with the same name

Efficient test length reduction techniques for interposer-based 2.5D ICs., , , , and . VLSI-DAT, page 1-4. IEEE, (2014)Fault Detection of Combinational Circuits Based on Supply Current., , , and . ITC, page 374-380. IEEE Computer Society, (1988)A built-in test circuit for open defects at interconnects between dies in 3D ICs., , , , and . 3DIC, page 1-5. IEEE, (2011)On Detecting Delay Faults Using Time-to-Digital Converter Embedded in Boundary Scan., , , and . IEICE Trans. Inf. Syst., 96-D (9): 1986-1993 (2013)Identification and Frequency Estimation of Feedback Bridging Faults Generating Logical Oscillation in CMOS Circuits., , and . IEICE Trans. Inf. Syst., 87-D (3): 571-579 (2004)Identification of Feedback Bridging Faults with Oscillation., , and . Asian Test Symposium, page 25-. IEEE Computer Society, (1999)Current Testable Design of Resistor String DACs., , , , and . ATS, page 399-403. IEEE, (2007)On Configuring Scan Trees to Reduce Scan Shifts based on a Circuit Structure., , , , and . DELTA, page 269-274. IEEE Computer Society, (2004)Practical Fault Coverage of Supply Current Tests for Bipolar ICs., , , and . DELTA, page 189-194. IEEE Computer Society, (2004)Test Data Reduction for BIST-Aided Scan Test Using Compatible Flip-Flops and Shifting Inverter Code., , and . Asian Test Symposium, page 163-166. IEEE Computer Society, (2010)