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A Sextuple Cross-Coupled SRAM Cell Protected against Double-Node Upsets.

A. Yan, Y. Chen, J. Zhou, J. Cui, T. Ni, X. Wen, и P. Girard. ATS, стр. 1-5. IEEE, (2020)

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Ying Ni

Pedestrian safety at urban signalised intersectionsY. Ni. TU Darmstadt, (2009)

Yi Ni

Ji Ni

Xiaoju Ni

Zhixu Ni

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LCHR-TSV: Novel Low Cost and Highly Repairable Honeycomb-Based TSV Redundancy Architecture for Clustered Faults.T. Ni, Y. Yao, H. Chang, L. Lu, H. Liang, A. Yan, Z. Huang, и X. Wen. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 39 (10): 2938-2951 (2020)A novel in-field TSV repair method for latent faults.T. Ni, H. Chang, H. Qi, и Z. Huang. IEICE Electron. Express, 15 (23): 20180873 (2018)SCLCRL: Shuttling C-elements based Low-Cost and Robust Latch Design Protected against Triple Node Upsets in Harsh Radiation Environments.A. Yan, Z. Li, S. Huang, Z. Zhai, X. Cheng, J. Cui, T. Ni, X. Wen, и P. Girard. DATE, стр. 1257-1262. IEEE, (2022)Design of True Random Number Generator Based on Multi-Stage Feedback Ring Oscillator.J. Cui, M. Yi, D. Cao, L. Yao, X. Wang, H. Liang, Z. Huang, H. Qi, T. Ni, и Y. Lu. IEEE Trans. Circuits Syst. II Express Briefs, 69 (3): 1752-1756 (2022)Fortune: A New Fault-Tolerance TSV Configuration in Router-Based Redundancy Structure.Q. Xu, H. Geng, T. Ni, S. Chen, B. Yu, Y. Kang, и X. Wen. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 41 (10): 3182-3187 (2022)A Sextuple Cross-Coupled Dual-Interlocked-Storage-Cell based Multiple-Node-Upset Self-Recoverable Latch.A. Yan, K. Qian, J. Cui, N. Cui, T. Ni, Z. Huang, и X. Wen. NANOARCH, стр. 1-6. IEEE, (2021)MRCO: A Multi-ring Convergence Oscillator-based High-Efficiency True Random Number Generator.T. Ni, Q. Peng, J. Bian, L. Yao, Z. Huang, A. Yan, и X. Wen. AsianHOST, стр. 1-6. IEEE, (2022)A 4NU-Recoverable and HIS-Insensitive Latch Design for Highly Robust Computing in Harsh Radiation Environments.A. Yan, A. Cao, Z. Fan, Z. Xu, T. Ni, P. Girard, и X. Wen. ACM Great Lakes Symposium on VLSI, стр. 301-306. ACM, (2021)A Test Method for Large-size TSV Considering Resistive Open Fault and Leakage Fault Coexistence.C. Hao, X. Yong, и T. Ni. VLSI-DAT, стр. 1-4. IEEE, (2021)A Robust and High-Performance Flip-Flop with Complete Soft-Error Recovery.A. Yan, X. Li, T. Ni, Z. Huang, и X. Wen. DSA, стр. 474-476. IEEE, (2023)

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