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Noise-induced dynamic variability in nano-scale CMOS SRAM cells.

C. Theodorou, M. Fadlallah, X. Garros, C. Dimitriadis, and G. Ghibaudo. ESSDERC, page 256-259. IEEE, (2016)

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Christoforos Neofytidis

Christoforos Papaioannou

Marina Theodorou

Panagiotis Theodorou

Angelika Theodorou

Other publications of authors with the same name

Hot carrier degradation modeling of short-channel n-FinFETs suitable for circuit simulators.I. Messaris, T. Karatsori, N. Fasarakis, C. Theodorou, S. Nikolaidis, G. Ghibaudo, and C. Dimitriadis. Microelectron. Reliab., (2016)Impact of front-back gate coupling on low frequency noise in 28 nm FDSOI MOSFETs.C. Theodorou, E. Ioannidis, S. Haendler, N. Planes, F. Arnaud, J. Jomaah, C. Dimitriadis, and G. Ghibaudo. ESSDERC, page 334-337. IEEE, (2012)Statistical characterization of drain current local and global variability in sub 15nm Si/SiGe Trigate pMOSFETs.R. Lavieville, T. Karatsori, C. Theodorou, S. Barraud, C. Dimitriadis, and G. Ghibaudo. ESSDERC, page 142-145. IEEE, (2016)Static and Low Frequency Noise Characterization of InGaAs MOSFETs and FinFETs on Insulator.T. Karatsori, K. Bennamane, C. Theodorou, L. Czornomaz, J. Fompeyrine, C. Zota, C. Convertino, and G. Ghibaudo. ESSDERC, page 166-169. IEEE, (2018)Inter-tier Coupling Analysis in Back-illuminated Monolithic 3DSI Image Sensor Pixels.P. Sideris, A. Peizerat, P. Batude, C. Theodorou, and G. Sicard. MOCAST, page 1-4. IEEE, (2021)Noise-induced dynamic variability in nano-scale CMOS SRAM cells.C. Theodorou, M. Fadlallah, X. Garros, C. Dimitriadis, and G. Ghibaudo. ESSDERC, page 256-259. IEEE, (2016)Statistical analysis of dynamic variability in 28nm FD-SOI MOSFETs.E. Ioannidis, S. Haendler, C. Theodorou, N. Planes, C. Dimitriadis, and G. Ghibaudo. ESSDERC, page 214-217. IEEE, (2014)In-depth electrical characterization of deca-nanometer InGaAs MOSFET down to cryogenic temperatures for low-power quantum applications.F. Maria, C. Theodorou, F. Balestra, G. Ghibaudo, E. Cha, and C. Zota. ESSDERC, page 257-260. IEEE, (2022)VERILOR: A Verilog-A Model of Lorentzian Spectra for Simulating Trap-related Noise in CMOS Circuits.A. Tataridou, G. Ghibaudo, and C. Theodorou. ESSDERC, page 247-250. IEEE, (2021)"Pinch to Detect": A Method to Increase the Number of Detectable RTN Traps in Nano-scale MOSFETs.A. Tataridou, G. Ghibaudo, and C. Theodorou. IRPS, page 1-5. IEEE, (2021)

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Disambiguation of "Theodorou, Christoforos G."

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Noise-induced dynamic variability in nano-scale CMOS SRAM cells.

Please choose a person to relate this publication to

Christoforos Neofytidis

Christoforos Papaioannou

Marina Theodorou

Panagiotis Theodorou

Angelika Theodorou

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Theodorou, Christoforos G."

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Noise-induced dynamic variability in nano-scale CMOS SRAM cells.

Please choose a person to relate this publication to

Christoforos Neofytidis

Christoforos Papaioannou

Marina Theodorou

Panagiotis Theodorou

Angelika Theodorou

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
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APA
Chicago
DIN 1505
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Noise-induced dynamic variability in nano-scale CMOS SRAM cells.