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Test Propagation Through Modules and Circuits., and . ITC, page 748-757. IEEE Computer Society, (1991)Codesign of architectures for automotive powertrain modules., , , and . IEEE Micro, 14 (4): 17-25 (1994)Huffman encoding of test sets for sequential circuits., , and . IEEE Trans. Instrum. Meas., 47 (1): 21-25 (1998)Deterministic built-in test pattern generation for high-performance circuits using twisted-ring counters., , and . IEEE Trans. Very Large Scale Integr. Syst., 8 (5): 633-636 (2000)Scalable Test Generators for High-Speed Datapath Circuits., , and . J. Electron. Test., 12 (1-2): 111-125 (1998)Online BIST for Embedded Systems., , and . IEEE Des. Test Comput., 15 (4): 17-24 (1998)Design of built-in test generator circuits using width compression., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 17 (10): 1044-1051 (1998)Hierarchical testing using precomputed tests for modules.. University of Michigan, USA, (1994)Optimal Space Compaction of Test Responses., , and . ITC, page 834-843. IEEE Computer Society, (1995)Test Width Compression for Built-In Self Testing., , , and . ITC, page 328-337. IEEE Computer Society, (1997)