Author of the publication

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Development of FF Circuits for Measures Against Power Supply Noise., , and . IOLTS, page 48-51. IEEE, (2019)A Low-Loss Built-In Current Sensor., and . J. Electron. Test., 14 (1-2): 39-48 (1999)Hybrid Rocket Engine Design Using Pairwise Ranking Surrogate-assisted Differential Evolution., , , and . GECCO Companion, page 1956-1962. ACM, (2023)Current Testable Design of Resistor String DACs., , , , and . ATS, page 399-403. IEEE, (2007)Dual Edge Triggered Flip-Flops for Noise Blocking and Application to Signal Delay Detection., and . Asian Test Symposium, page 119-124. IEEE Computer Society, (2012)Simulation of resistive bridging fault to minimize the presence of intermediate voltage and oscillation in CMOS circuits., , and . Asian Test Symposium, page 120-124. IEEE Computer Society, (2000)Simulation-based analysis of FF behavior in presence of power supply noise., and . IOLTS, page 151-156. IEEE, (2017)LSI aging estimation using ring oscillators., and . ETS, page 1-2. IEEE, (2015)Ramp Voltage Testing for Detecting Interconnect Open Faults.. IEICE Trans. Inf. Syst., 91-D (3): 700-705 (2008)A Case Study of Mixed-Signal Integrated Circuit Testing: An Application of Current Testing Using the Upper Limit and the Lower Limit., , and . ISCAS, page 77-80. IEEE, (1994)