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Disambiguation of "Marca, Vincenzo Della"

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40nm SONOS Embedded Select in Trench Memory.

, , , , , , , , , , , , and . ESSDERC, page 21-24. IEEE, (2023)

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Sergio Dellavalle

Giuseppe Marca

Robert Marcau

Nikolaus Marcard

Diana Alejandra Marcano Romero

 

Other publications of authors with the same name

Impact of endurance degradation on the programming efficiency and the energy consumption of NOR flash memories., , , , and . Microelectron. Reliab., 54 (9-10): 2262-2265 (2014)A Self-referenced and regulated sensing solution for PCM with OTS selector., , , , , , and . VLSI-SoC, page 1-6. IEEE, (2021)Quantitative correlation between Flash and equivalent transistor for endurance electrical parameters extraction., , , , , and . Microelectron. Reliab., (2018)AC stress reliability study of a new high voltage transistor for logic memory circuits., , , , , and . IRPS, page 1-5. IEEE, (2020)True random number generation exploiting SET voltage variability in resistive RAM memory arrays., , , , , , and . NVMTS, page 1-5. IEEE, (2019)Benchmarking and optimization of trench-based multi-gate transistors in a 40 nm non-volatile memory technology., , , , , and . DTIS, page 1-4. IEEE, (2021)Threshold voltage bitmap analysis methodology: Application to a 512kB 40nm Flash memory test chip., , , , , , , , and . IRPS, page 6. IEEE, (2018)Effect of ions presence in the SiOCH inter metal dielectric structure., , , , , , , and . ESSDERC, page 218-221. IEEE, (2013)Effects of Lightly Doped Drain and Channel Doping Variations on Flash Memory Performances and Reliability., , , , , , and . J. Low Power Electron., 8 (5): 717-724 (2012)A Regulated Sensing Solution Based on a Self-reference Principle for PCM + OTS Memory Array., , , , , , and . VLSI-SoC (Selected Papers), volume 661 of IFIP Advances in Information and Communication Technology, page 225-243. Springer, (2021)