( en | de | ru )

 

Disambiguation of "Kinoshita, Kozo"

Author of the publication

copydeleteadd this publication to your clipboard
Built-in Self-Test for State Faults Induced by Crosstalk in Sequential Circuits.

, , and . Asian Test Symposium, page 469. IEEE Computer Society, (2001)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Kozo Yabuta

Asako Kinoshita

Asako Kinoshita

Kozo Kosugi

Yvette Kozova-Razanantoanina

 

Other publications of authors with the same name

Design of testing circuit and test generation for built-in current testing., , and . Syst. Comput. Jpn., 24 (5): 73-82 (1993)Cascade Realization of 3-Input 3-Output Conservative Logic Circuits., and . IEEE Trans. Computers, 27 (3): 214-221 (1978)Low-capture-power test generation for scan-based at-speed testing., , , , , , and . ITC, page 10. IEEE Computer Society, (2005)Channel Width Test Data Compression under a Limited Number of Test Inputs and Outputs., , , and . VLSI Design, page 329-334. IEEE Computer Society, (2003)Partially Parallel Scan Chain for Test Length Reduction by Using Retiming Technique., , and . Asian Test Symposium, page 94-99. IEEE Computer Society, (1996)An Algorithmic Test Generation Method for Crosstalk Faults in Synchronous Sequential Circuits., , and . Asian Test Symposium, page 22-. IEEE Computer Society, (1997)Procedure to Overcome the Byzantine General's Problem for Bridging Faults in CMOS Circuits., , and . Asian Test Symposium, page 121-126. IEEE Computer Society, (1999)IDDQ Current Dependency on Test Vectors and Bridging Resistance., , and . Asian Test Symposium, page 158-163. IEEE Computer Society, (1999)Resynthesis for sequential circuits designed with a specified initial state., , and . VTS, page 152-157. IEEE Computer Society, (1995)A BIST Circuit for IDDQ Tests., , , , , and . Asian Test Symposium, page 390-395. IEEE Computer Society, (2003)