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Disambiguation of "Rodríguez-Montañés, Rosa"

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Test Escapes of Stuck-Open Faults Caused by Parasitic Capacitances and Leakage Currents.

, , and . IEEE Trans. Very Large Scale Integr. Syst., 24 (5): 1739-1748 (2016)

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Daniel Rodríguez

Carlos Rodríguez

Agustín Rodríguez

Jerónimo Rodríguez

Carlos Rodríguez

 

Other publications of authors with the same name

Analysis of Bridging Defects in Sequential CMOS Circuits and their Current Testability., and . EDAC-ETC-EUROASIC, page 356-360. IEEE Computer Society, (1994)Bridging Defects Resistance Measurements in a CMOS Process., , and . ITC, page 892-899. IEEE Computer Society, (1992)Estimation of the Defective IDDQ Caused by Shorts in Deep-Submicron CMOS ICs., and . DATE, page 490-494. IEEE Computer Society, (1998)Post-bond test of Through-Silicon Vias with open defects., , and . ETS, page 1-6. IEEE, (2014)Test Escapes of Stuck-Open Faults Caused by Parasitic Capacitances and Leakage Currents., , and . IEEE Trans. Very Large Scale Integr. Syst., 24 (5): 1739-1748 (2016)Power-aware voltage tuning for STT-MRAM reliability., , , , , , and . ETS, page 1-6. IEEE, (2015)IDDQ testing: state of the art and future trends., , , , and . Integr., 26 (1-2): 167-196 (1998)RTL Level Preparation of High-Quality/Low-Energy/Low-Power BIST., , , , , and . ITC, page 814-823. IEEE Computer Society, (2002)Bridges in sequential CMOS circuits: current-voltage signatur., and . VTS, page 68-73. IEEE Computer Society, (1997)Read/write robustness estimation metrics for spin transfer torque (STT) MRAM cell., , , , , and . DATE, page 447-452. ACM, (2015)