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Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test., , , , , , , , , and . DDECS, page 1-6. IEEE, (2019)Parallel Multithread Analysis of Extremely Large Simulation Traces., , , , , , and . IEEE Access, (2022)An Optimized Test During Burn-In for Automotive SoC., , , , , , , and . IEEE Des. Test, 35 (3): 46-53 (2018)Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures., , , , , , , and . DDECS, page 69-74. IEEE, (2021)A low-ripple voltage tripler., , , , , , and . ISCAS, IEEE, (2006)A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress., , , , , , , , , and 1 other author(s). IEEE Trans. Computers, 72 (5): 1447-1459 (May 2023)Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC., , , , , , and . J. Electron. Test., 34 (1): 43-52 (2018)An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In., , , , , , , , , and 1 other author(s). J. Low Power Electron., 14 (1): 86-98 (2018)Innovative methods for Burn-In related Stress Metrics Computation., , , , , , , , and . DTIS, page 1-6. IEEE, (2021)Road Signs Recognition Using a Dynamic Pixel Aggregation Technique in the HSV Color Space., , , and . ICIAP, page 572-577. IEEE Computer Society, (2001)