( en | de | ru )

 

Disambiguation of "Agbo, Innocent"

Author of the publication

copydeleteadd this publication to your clipboard
Comparative BTI analysis for various sense amplifier designs.

, , , , , , and . DDECS, page 68-73. IEEE, (2016)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Innocent Nsengimana

Christopher Yao Agbotse

Bernard Philibert Agbo

Innocent Tchigio

Innocent Nsengimana

 

Other publications of authors with the same name

Big Data Architecture: Designing the Right Solution for Social Network Analysis., , and . ISDFS, page 1-5. IEEE, (2020)BTI impact on SRAM sense amplifier., , and . IDT, page 1-6. IEEE, (2013)Bias Temperature Instability analysis of FinFET based SRAM cells., , , , , , and . DATE, page 1-6. European Design and Automation Association, (2014)Methodology for Application-Dependent Degradation Analysis of Memory Timing., , , , , , and . DATE, page 162-167. IEEE, (2019)Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM., , , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 27 (6): 1308-1321 (2019)Degradation analysis of high performance 14nm FinFET SRAM., , , , , , and . DATE, page 201-206. IEEE, (2018)Hardware-Based Aging Mitigation Scheme for Memory Address Decoder., , , , , , and . ETS, page 1-6. IEEE, (2019)Software-Based Mitigation for Memory Address Decoder Aging., , , , , , and . LATS, page 1-6. IEEE, (2019)Reliability Modeling and Mitigation for Embedded Memories., , and . ITC, page 1-10. IEEE, (2019)Corporate Governance Committees and Financial Performance An Empirical Study of Healthcare Companies in Nigeria. INTERNATIONAL JOURNAL OF TREND IN SCIENTIFIC RESEARCH AND DEVELOPMENT, 7 (2): 296-302 (April 2023)