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Disambiguation of "Roussel, Philippe"

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The relationship between border traps characterized by AC admittance and BTI in III-V MOS devices.

, , , , , , , , , , , and . IRPS, page 5. IEEE, (2015)

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Nicolas Roussel

Kevin Roussel

Martin Roussel

Philippe Destouches

Philippe Staib

 

Other publications of authors with the same name

Editing First-Order Proofs: Programmed Rules vs Derived Rules., , and . SLP, page 92-98. IEEE-CS, (1984)Circuit and process co-design with vertical gate-all-around nanowire FET technology to extend CMOS scaling for 5nm and beyond technologies., , , , , , , , , and 6 other author(s). ESSDERC, page 102-105. IEEE, (2014)Estimation des titres viraux : une programmation pratique et fiable sur calculatrice de poche, et accessible par l'Internet., and . Monde des Util. Anal. Données, (2006)Insight to Data Retention loss in ferroelectric Hf0.5Zr0.5O2 pFET and nFET from simultaneous PV and IV measurements., , , , , , , , , and . VLSI Technology and Circuits, page 340-342. IEEE, (2022)Approximating Standard Cell Delay Distributions by Reformulating the Most Probable Failure Point., , , , and . ERMAVSS@DATE, volume 1566 of CEUR Workshop Proceedings, page 13-16. CEUR-WS.org, (2016)Variability aware modeling for yield enhancement of SRAM and logic., , , and . DATE, page 1153-1158. IEEE, (2011)Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors., , , , , , , and . OFC, page 1-3. IEEE, (2022)Defect-centric perspective of time-dependent BTI variability., , , , , and . Microelectron. Reliab., 52 (9-10): 1883-1890 (2012)Understanding the Impact of Time-Dependent Random Variability on Analog ICs: From Single Transistor Measurements to Circuit Simulations., , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 27 (3): 601-610 (2019)Comphy - A compact-physics framework for unified modeling of BTI., , , , , , , , , and 4 other author(s). Microelectron. Reliab., (2018)