Inproceedings,
Modeling FinFET metal gate stack resistance for 14nm node and beyond.
K. Miyaguchi, B. Parvais, L. Ragnarsson, P. Wambacq, P. Raghavan, A. Mercha, A. Mocuta, D. Verkest, and A. Thean.ICICDT, page 1-4. IEEE, (2015)
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- conf/icicdt/MiyaguchiPRWRMM15
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- inproceedings
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- ICICDT
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- 2015
- pages
- 1-4
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- IEEE
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- conf/icicdt/2015
- ee
- http://dx.doi.org/10.1109/ICICDT.2015.7165885
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- 978-1-4799-7669-0
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- http://dblp.uni-trier.de/db/conf/icicdt/icicdt2015.html#MiyaguchiPRWRMM15
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- please select -%0 Conference Paper
%1 conf/icicdt/MiyaguchiPRWRMM15
%A Miyaguchi, Kenichi
%A Parvais, Bertrand
%A Ragnarsson, Lars-Åke
%A Wambacq, Piet
%A Raghavan, Praveen
%A Mercha, Abdelkarim
%A Mocuta, Anda
%A Verkest, Diederik
%A Thean, Aaron
%B ICICDT
%D 2015
%I IEEE
%K dblp
%P 1-4
%T Modeling FinFET metal gate stack resistance for 14nm node and beyond.
%U http://dblp.uni-trier.de/db/conf/icicdt/icicdt2015.html#MiyaguchiPRWRMM15
%@ 978-1-4799-7669-0
@inproceedings{conf/icicdt/MiyaguchiPRWRMM15,
added-at = {2016-05-17T00:00:00.000+0200},
author = {Miyaguchi, Kenichi and Parvais, Bertrand and Ragnarsson, Lars-Åke and Wambacq, Piet and Raghavan, Praveen and Mercha, Abdelkarim and Mocuta, Anda and Verkest, Diederik and Thean, Aaron},
biburl = {https://www.bibsonomy.org/bibtex/2feceefdb17a55fdffcc6b74985d13c52/dblp},
booktitle = {ICICDT},
crossref = {conf/icicdt/2015},
ee = {http://dx.doi.org/10.1109/ICICDT.2015.7165885},
interhash = {9235f9b3c60a0dcc858a81a37498b9ef},
intrahash = {feceefdb17a55fdffcc6b74985d13c52},
isbn = {978-1-4799-7669-0},
keywords = {dblp},
pages = {1-4},
publisher = {IEEE},
timestamp = {2016-05-18T11:45:05.000+0200},
title = {Modeling FinFET metal gate stack resistance for 14nm node and beyond.},
url = {http://dblp.uni-trier.de/db/conf/icicdt/icicdt2015.html#MiyaguchiPRWRMM15},
year = 2015
}