%0 Journal Article %1 journals/mr/Garcia-SanchezO15 %A García-Sánchez, Francisco J. %A Ortiz-Conde, Adelmo %A Muci, Juan %A Sucre-González, Andrea %A Liou, Juin J. %D 2015 %J Microelectron. Reliab. %K dblp %N 2 %P 293-307 %T A unified look at the use of successive differentiation and integration in MOSFET model parameter extraction. %U http://dblp.uni-trier.de/db/journals/mr/mr55.html#Garcia-SanchezO15 %V 55

@article{journals/mr/Garcia-SanchezO15, added-at = {2020-12-29T00:00:00.000+0100}, author = {García-Sánchez, Francisco J. and Ortiz-Conde, Adelmo and Muci, Juan and Sucre-González, Andrea and Liou, Juin J.}, biburl = {https://www.bibsonomy.org/bibtex/29f182f14382fd3cfe8d31d916c71e0c6/dblp}, ee = {https://doi.org/10.1016/j.microrel.2014.11.013}, interhash = {d6f99ce9710204d7264fff312b081917}, intrahash = {9f182f14382fd3cfe8d31d916c71e0c6}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 2, pages = {293-307}, timestamp = {2024-04-09T02:48:51.000+0200}, title = {A unified look at the use of successive differentiation and integration in MOSFET model parameter extraction.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr55.html#Garcia-SanchezO15}, volume = 55, year = 2015 }