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Disambiguation of "Ortiz-Conde, Adelmo"

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A unified look at the use of successive differentiation and integration in MOSFET model parameter extraction.

, , , , and . Microelectron. Reliab., 55 (2): 293-307 (2015)

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Richard Ortiz Ortiz

Adrían Enrique Ortiz Rojas

Narciso Luis Conde

Sékou Condé

Nicolas Condette

 

Other publications of authors with the same name

A review of DC extraction methods for MOSFET series resistance and mobility degradation model parameters., , , , , , and . Microelectron. Reliab., (2017)Comments on Ä sinh Resistor and Its Application to tanh Linearization"., , , , and . IEEE J. Solid State Circuits, 41 (10): 2359 (2006)Influence of polysilicon-gate depletion on the subthreshold behavior of submicron MOSFETs., , , , , , , and . Microelectron. Reliab., 42 (3): 343-347 (2002)Integration-based approach to evaluate the sub-threshold slope of MOSFETs., , , and . Microelectron. Reliab., 50 (2): 312-315 (2010)Indirect fitting procedure to separate the effects of mobility degradation and source-and-drain resistance in MOSFET parameter extraction., , , , , , and . Microelectron. Reliab., 49 (7): 689-692 (2009)Quasi-three-dimensional spice-based simulation of the transient behavior, including plasma spread, of thyristors and over-voltage protectors., , and . Microelectron. Reliab., 42 (1): 67-76 (2002)An explicit multi-exponential model for semiconductor junctions with series and shunt resistances., , , , , and . Microelectron. Reliab., 51 (12): 2044-2048 (2011)A review of recent MOSFET threshold voltage extraction methods., , , , , and . Microelectron. Reliab., 42 (4-5): 583-596 (2002)Implementation of a comprehensive and robust MOSFET model in cadence SPICE for ESD applications., , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 21 (12): 1497-1502 (2002)A unified look at the use of successive differentiation and integration in MOSFET model parameter extraction., , , , and . Microelectron. Reliab., 55 (2): 293-307 (2015)