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The defect-centric perspective of device and circuit reliability - From individual defects to circuits., , , , , , , , , и 5 other автор(ы). ESSDERC, стр. 218-225. IEEE, (2015)Time dependent variability in RMG-HKMG FinFETs: Impact of extraction scheme on stochastic NBTI., , , , , и . IRPS, стр. 3. IEEE, (2015)A Pragmatic Model to Predict Future Device Aging., , , , , , , , , и 1 other автор(ы). IEEE Access, (2023)Understanding the Potential and the Limits of Germanium pMOSFETs for VLSI Circuits From Experimental Measurements., , , , и . IEEE Trans. Very Large Scale Integr. Syst., 19 (9): 1569-1582 (2011)Buried Silicon-Germanium pMOSFETs: Experimental Analysis in VLSI Logic Circuits Under Aggressive Voltage Scaling., , , , , , , , и . IEEE Trans. Very Large Scale Integr. Syst., 20 (8): 1487-1495 (2012)FinFET and MOSFET preliminary comparison of gate oxide reliability., , , , , и . Microelectron. Reliab., 46 (9-11): 1608-1611 (2006)A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability., , , , , , , , , и 4 other автор(ы). Microelectron. Reliab., (2018)Investigating Nanowire, Nanosheet and Forksheet FET Hot-Carrier Reliability via TCAD Simulations: Invited Paper., , , , , , , , и . IRPS, стр. 1-10. IEEE, (2023)Improving the Tamper-Aware Odometer Concept by Enhancing Dynamic Stress Operation., , , , , и . IRPS, стр. 1-9. IEEE, (2023)Reliability and Variability-Aware DTCO Flow: Demonstration of Projections to N3 FinFET and Nanosheet Technologies., , , , , , , , , и 10 other автор(ы). IRPS, стр. 1-6. IEEE, (2021)