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A novel SEU injection setup for Automotive SoC., , , , , , , и . ISIE, стр. 623-626. IEEE, (2022)Recent Trends and Perspectives on Defect-Oriented Testing., , , , , , , , , и 11 other автор(ы). IOLTS, стр. 1-10. IEEE, (2022)Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level., , , , , , , и . DFT, стр. 1-6. IEEE, (2022)Test Considerations about the Structured ASIC Paradigm., и . DDECS, стр. 232-233. IEEE Computer Society, (2006)Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures., , , , , , , и . DDECS, стр. 69-74. IEEE, (2021)A guided debugger-based fault injection methodology for assessing functional test programs., , , , , и . VTS, стр. 1-7. IEEE, (2023)A Novel SBST Generation Technique for Path-Delay Faults in Microprocessors Exploiting Gate- and RT-Level Descriptions., , , , , и . VTS, стр. 389-394. IEEE Computer Society, (2008)Scan-chain intra-cell defects grading., , , , , , и . DTIS, стр. 1-6. IEEE, (2015)On the in-field testing of spare modules in automotive microprocessors., , , , , и . VLSI-SoC, стр. 1-6. IEEE, (2017)Cumulative embedded memory failure bitmap display & analysis., , , , , , , и . DDECS, стр. 255-260. IEEE Computer Society, (2010)