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Disambiguation of "Dufaza, Christian"

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LFSROM an algorithm for automatic design synthesis of hardware test pattern generator.

, , and . VTS, page 208-214. IEEE Computer Society, (1993)

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Christian Christian

Christian Winter

Gold-katalysierte Cycloisomerisierung funktionalisierter Allene und Anwendung in der Naturstoffsynthese. TU Dortmund, (2009)

Christian Helbig

Synthese und Charakterisierung von metallorganischen Bronzen. Uni Augsburg, (2009)

Christian Schüller

Automatisierte Feedbackgenerierung in der benutzerzentrierten Softwareentwicklung am Beispiel mobiler Anwendungen. TU München, (2009)

Christian Döring

Die Expression der E3 Ligasen Murf - 1 und MafBx nach Induktion einer Herzinsuffizienz, Einfluss von körperlichem Training. Uni Leipzig, (2009)
 

Other publications of authors with the same name

Theoretical properties of LFSRs for built-in self test.. Integr., 25 (1): 17-35 (1998)Test Synthesis for DC Test and Maximal Diagnosis of Switched-Capacitor Circuits., and . VTS, page 252-260. IEEE Computer Society, (1997)Signoff power methodology for contactless smartcards., , and . ISLPED, page 407-410. ACM, (2007)Tolerance DC bands of CMOS operational amplifier., and . Asian Test Symposium, page 140-. IEEE Computer Society, (1995)A partial tree vector quantizer dynamic element matching technique for audio Δ-Σ converters., , , , and . CICC, page 1-4. IEEE, (2011)Methodology for Dynamic Power Verification of Contactless Smartcards., , and . PATMOS, volume 4148 of Lecture Notes in Computer Science, page 280-291. Springer, (2006)Quasi-Linear FSMS and their Application to the Generation of Deterministic and Pseudo-random Test Vectors., , and . VLSI Design, page 350-351. IEEE Computer Society, (1992)Test Structure for IC(VBE) Parameter Determination of Low Voltage Applications., , , , , and . DATE, page 316-321. IEEE Computer Society, (2002)Low-noise CMOS analog-to-digital interface for MEMS resistive microphone., , , , , , , , , and . ICECS, page 445-448. IEEE, (2013)A BIST-DFT technique for DC test of analog modules., and . J. Electron. Test., 9 (1-2): 117-133 (1996)