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Disambiguation of "Landrault, Christian"

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Quasi-Linear FSMS and their Application to the Generation of Deterministic and Pseudo-random Test Vectors.

, , and . VLSI Design, page 350-351. IEEE Computer Society, (1992)

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Christian Christian

Christian Winter

Gold-katalysierte Cycloisomerisierung funktionalisierter Allene und Anwendung in der Naturstoffsynthese. TU Dortmund, (2009)

Christian Helbig

Synthese und Charakterisierung von metallorganischen Bronzen. Uni Augsburg, (2009)

Christian Schüller

Automatisierte Feedbackgenerierung in der benutzerzentrierten Softwareentwicklung am Beispiel mobiler Anwendungen. TU München, (2009)

Christian Döring

Die Expression der E3 Ligasen Murf - 1 und MafBx nach Induktion einer Herzinsuffizienz, Einfluss von körperlichem Training. Uni Leipzig, (2009)
 

Other publications of authors with the same name

Effectiveness of a Variable Sampling Time Strategy for Delay Fault Diagnosis., , , and . EDAC-ETC-EUROASIC, page 518-523. IEEE Computer Society, (1994)A Gated Clock Scheme for Low Power Scan-Based BIST., , , , and . IOLTW, page 87-89. IEEE Computer Society, (2001)An optimized BIST test pattern generator for delay testing., , , and . VTS, page 94-100. IEEE Computer Society, (1997)A Test Vector Inhibiting Technique for Low Energy BIST Design., , , and . VTS, page 407-412. IEEE Computer Society, (1999)An adjacency-based test pattern generator for low power BIST design., , , and . Asian Test Symposium, page 459-464. IEEE Computer Society, (2000)Low power BIST design by hypergraph partitioning: methodology and architectures., , , and . ITC, page 652-661. IEEE Computer Society, (2000)Design of Routing-Constrained Low Power Scan Chains., , , , , and . DELTA, page 287-294. IEEE Computer Society, (2004)Electrical Simulation Model of the 2T-FLOTOX Core-Cell for Defect Injection and Faulty Behavior Prediction in eFlash Memories., , , , , and . ETS, page 77-84. IEEE Computer Society, (2007)A SPICE-Like 2T-FLOTOX Core-Cell Model for Defect Injection and Faulty Behavior Prediction in eFlash., , , , , and . J. Electron. Test., 25 (2-3): 127-144 (2009)Hardware Generation of Random Single Input Change Test Sequences., , , , and . J. Electron. Test., 18 (2): 145-157 (2002)