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High efficient low cost EEPROM screening method in combination with an area optimized byte replacement strategy which enables high reliability EEPROMs.

, , , and . VTS, page 1-6. IEEE Computer Society, (2018)

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Fast Bit Screening of Automotive Grade EEPROMs - Continuous Improvement Exercise., , and . IEEE Trans. Very Large Scale Integr. Syst., 25 (4): 1250-1260 (2017)High efficient low cost EEPROM screening method in combination with an area optimized byte replacement strategy which enables high reliability EEPROMs., , , and . VTS, page 1-6. IEEE Computer Society, (2018)Variation and failure characterization through pattern classification of test data from multiple test stages., , , , , , and . ITC, page 1-10. IEEE, (2016)An Efficient Contact Screening Method and its Application to High-Reliability Non-Volatile Memories., and . J. Electron. Test., 32 (4): 447-458 (2016)Scalable High Voltage CMOS technology for Smart Power and sensor applications., , , , , , , , , and . Elektrotech. Informationstechnik, 125 (4): 109-117 (2008)A Non-Volatile Embedded Memory for High Temperature Automotive and High-Retention Applications., , , , , , , and . ISQED, page 591-596. IEEE Computer Society, (2006)Yield improvement of an EEPROM for automotive applications while maintaining high reliability., , and . VTS, page 1-6. IEEE Computer Society, (2016)