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Disambiguation of "Hubert, Guillaume"

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Laser-induced fault effects in security-dedicated circuits.

, , , , , , , , , , , , , , , , , , and . VLSI-SoC, page 1-6. IEEE, (2014)

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Guillaume Pierre

Guillaume Klein

Guillaume Jacques

Guillaume Schurgers

Guillaume Weick

 

Other publications of authors with the same name

SEE sensitivity of a COTS 28-nm SRAM-based FPGA under thermal neutrons and different incident angles., , , , , , and . Microprocess. Microsystems, (February 2023)Ray-Spect: Local Parametric Degradation for Secure Designs: An application to X-Ray Fault Injection., , , , and . IOLTS, page 1-7. IEEE, (2023)Laser-Induced Fault Effects in Security-Dedicated Circuits., , , , , , , , , and 5 other author(s). VLSI-SoC (Selected Papers), volume 464 of IFIP Advances in Information and Communication Technology, page 220-240. Springer, (2014)Evidence of a Dynamic Fault Model in the DICE Radiation-Hardened Cell., , , and . SBCCI, page 1-6. IEEE, (2020)Sleep Transistors to Improve the Process Variability and Soft Error Susceptibility., , , , , and . ICECS, page 582-585. IEEE, (2019)Circuit-Level Techniques to Mitigate Process Variability and Soft Errors in FinFET Designs., , , , , and . VLSI-SoC, page 240-241. IEEE, (2019)Layout-aware laser fault injection simulation and modeling: From physical level to gate level., , , , and . DTIS, page 1-6. IEEE, (2014)Further Analysis of Laser-induced IR-drop., , , , and . ATS, page 91-96. IEEE, (2021)Multiple Event Transient Induced by Nuclear Reactions in CMOS Logic Cells., , , , , , , , , and 1 other author(s). IOLTS, page 137-145. IEEE Computer Society, (2007)A Review of DASIE Code Family: Contribution to SEU/MBU Understanding., , , , , , , , , and 1 other author(s). IOLTS, page 87-94. IEEE Computer Society, (2005)