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Impact of Atmospheric and Space Radiation on Sensitive Electronic Devices., , , and . ETS, page 1-10. IEEE, (2022)A Detailed Electrical Analysis of SEE on 28 nm FDSOI SRAM Architectures., , , , , , and . SBCCI, page 1-6. IEEE, (2023)Evaluation of test algorithms stress effect on SRAMs under neutron radiation., , , , , , , , and . IOLTS, page 121-122. IEEE Computer Society, (2012)Characterization of an SRAM based particle detector for mixed-field radiation environments., , , , , , , , , and 2 other author(s). IWASI, page 75-80. IEEE, (2013)Multiple Event Transient Induced by Nuclear Reactions in CMOS Logic Cells., , , , , , , , , and 1 other author(s). IOLTS, page 137-145. IEEE Computer Society, (2007)Use of Nuclear Codes for Neutron-Induced Nuclear Reactions in Microelectronics.. IOLTS, page 82-86. IEEE Computer Society, (2005)A Review of DASIE Code Family: Contribution to SEU/MBU Understanding., , , , , , , , , and 1 other author(s). IOLTS, page 87-94. IEEE Computer Society, (2005)Prediction of Transient Induced by Neutron/Proton in CMOS Combinational Logic Cells., , , , , , , and . IOLTS, page 63-74. IEEE Computer Society, (2006)Real-time SRAM based particle detector., , , , and . IWASI, page 58-62. IEEE, (2015)Evaluation and Analysis of Technologies for Robotic Platforms for the Nuclear Decommissioning., , , , , , , , , and 4 other author(s). DTIS, page 1-6. IEEE, (2020)