( en | de | ru )

 

Disambiguation of "Roy, Scott"

Author of the publication

copydeleteadd this publication to your clipboard
Hierarchical composable optimization of web pages.

, , , , , , , , and . WWW (Companion Volume), page 53-62. ACM, (2012)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Martina Christine Scotti

Pierre-François Scotto

Peter Scott

Felix Markus Hubertus Scotti

James Wesley Scott

 

Other publications of authors with the same name

An advanced statistical compact model strategy for SRAM simulation at reduced VDD., , , , and . ESSDERC, page 205-208. IEEE, (2012)Evaluating the accuracy of SRAM margin simulation through large scale Monte-Carlo simulations with accurate compact models., , , , , and . ICICDT, page 29-32. IEEE, (2013)Impact of statistical parameter set selection on the statistical compact model accuracy: BSIM4 and PSP case study., , , , and . Microelectron. J., 44 (1): 7-14 (2013)An Optimal First Order Method Based on Optimal Quadratic Averaging., , and . SIAM J. Optimization, 28 (1): 251-271 (2018)Electromagnetic radiation from ingested sources in the human intestine between 150 MHz and 1.2 GHz., , , and . IEEE Trans. Biomed. Eng., 50 (4): 484-492 (2003)The Caenorhabditis globin gene family reveals extensive nematode-specific radiation and diversification, , , , , , , , and . BMC Evolutionary Biology, 8 (1): 279 (October 2008)Impact of Random Dopant Induced Statistical Variability on Inverter Switching Trajectories and Timing Variability., , , and . ISCAS, page 577-580. IEEE, (2009)Optimum partitioning of topologically rectangular grids., , and . EUROSIM, page 179-185. Elsevier, (1996)Search results based N-best hypothesis rescoring with maximum entropy classification., , , and . ASRU, page 422-427. IEEE, (2013)Modeling and simulation of transistor and circuit variability and reliability., , , , , , , , and . CICC, page 1-8. IEEE, (2010)