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Evaluation of TFET and FinFET devices and 32-Bit CLA circuits considering work function variation and line-edge roughness.

, , , , , и . ISCAS, стр. 2325-2328. IEEE, (2015)

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Gerhard Vita

Vita Paliokaite

Vita Graudins

Vita Feldmann

Vita Kondratenko

 

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