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Disambiguation of "Lee, Brandon"

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Accelerator-Based Thermal-Neutron Beam by Compact and Low-Cost Moderator for Soft-Error Evaluation in Semiconductor Devices.

, , , , , , , , and . IRPS, page 53-1. IEEE, (2022)

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Brandon Dravie

Brandon Look

Brandon Rothrock

Brandon Cline

Brandon Noia

 

Other publications of authors with the same name

Advanced Self-heating Model and Methodology for Layout Proximity Effect in FinFET Technology., , , , , , , , , and 3 other author(s). IRPS, page 1-5. IEEE, (2020)Thermal-Neutron SER Mitigation by Cobalt-Contact in 7 nm Bulk-FinFET Technology., , , , , , , , and . IRPS, page 7. IEEE, (2022)Centralized Clinical Trial Imaging Data Management: Practical Guidance from a Comprehensive Cancer Center's Experience., , , , , and . J. Digital Imaging, 32 (5): 849-854 (2019)Advanded Design Verification and Debugging Techniques Based on Optical Fault Isolation Method., , , and . ISOCC, page 44-45. IEEE, (2019)Soft-Error Susceptibility in Flip-Flop in EUV 7 nm Bulk-FinFET Technology., , , , , , , , , and 1 other author(s). IRPS, page 1-7. IEEE, (2021)Drusen Detection in a Retinal Image Using Multi-level Analysis., and . MICCAI (1), volume 2878 of Lecture Notes in Computer Science, page 618-625. Springer, (2003)Reliability on EUV Interconnect Technology for 7nm and beyond., , , , , , , , , and 7 other author(s). IRPS, page 1-4. IEEE, (2020)Accelerator-Based Thermal-Neutron Beam by Compact and Low-Cost Moderator for Soft-Error Evaluation in Semiconductor Devices., , , , , , , , and . IRPS, page 53-1. IEEE, (2022)Responding to epidemic-driven demand: the role of supply channels., , , , and . Int. J. Prod. Res., 62 (5): 1879-1900 (March 2024)Market Mediators and the Trade-offs of Legitimacy-Seeking Behaviors in a Nascent Category., , and . Organ. Sci., 28 (3): 447-470 (2017)