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An active rectifier with optimal flip timing for the internal capacitor for piezoelectric vibration energy harvesting.

, , , , and . MWSCAS, page 1-4. IEEE, (2015)

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Test Data Compression Using Selective Sparse Storage., , and . J. Electron. Test., 27 (4): 565-577 (2011)Representative Scan Architecture., and . Journal of Circuits, Systems, and Computers, 25 (5): 1650040:1-1650040:8 (2016)A Pseudo-Random Transform Decomposition Method for Improving the Coding Compression Ratio of Test Data., , , and . HPCC/SmartCity/DSS, page 1611-1618. IEEE, (2019)IDDT ATPG Based on Ambiguous Delay Assignments., , , and . Asian Test Symposium, page 400-405. IEEE Computer Society, (2003)A New BIST Solution for System-on-Chip., and . PRDC, page 109-113. IEEE Computer Society, (2005)Test Response Data Volume and Wire Length Reductions for Extended Compatibilities Scan Tree Construction., , and . DELTA, page 308-313. IEEE Computer Society, (2008)A novel memristor-based restricted Boltzmann machine for contrastive divergence., , , , and . IEICE Electron. Express, 15 (2): 20171062 (2018)Capture in Turn Scan for Reduction of Test Data Volume, Test Application Time and Test Power., , , , and . Asian Test Symposium, page 371-374. IEEE Computer Society, (2010)Test Data Compression Using Four-Coded and Sparse Storage for Testing Embedded Core., , and . ICA3PP (2), volume 6082 of Lecture Notes in Computer Science, page 434-443. Springer, (2010)Improve the compression ratios for code-based test vector compressions by decomposing., , , and . ETS, page 1-6. IEEE, (2015)