Author of the publication

Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies using SQUID, GMR and MTJ systems.

, , , , , , and . Microelectron. Reliab., 44 (9-11): 1559-1563 (2004)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICs., , , , , and . Microelectron. Reliab., 48 (8-9): 1529-1532 (2008)Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies using SQUID, GMR and MTJ systems., , , , , , and . Microelectron. Reliab., 44 (9-11): 1559-1563 (2004)Test methodology of a new upset mechanism induced by protons in deep sub-micron devices., , , , , and . Microelectron. Reliab., 52 (9-10): 2482-2486 (2012)Backside Hot Spot Detection Using Liquid Crystal Microscopy., , , , , , , and . Microelectron. Reliab., 42 (9-11): 1741-1746 (2002)Magnetic emission mapping for passive integrated components characterisation., , , , , , , and . Microelectron. Reliab., 43 (9-11): 1809-1814 (2003)Radiation robustness of normally-off GaN/HEMT power transistors (COTS)., and . Microelectron. Reliab., (2018)Magnetic field measurements for Non Destructive Failure Analysis., , , , , and . Microelectron. Reliab., 42 (9-11): 1763-1766 (2002)Investigation of the Impact of Neutron Irradiation on SiC Power MOSFETs lifetime by Reliability Tests., , , , , , , , , and 1 other author(s). Sensors, 21 (16): 5627 (2021)Using the EM simulation tools to predict the Conducted Emissions level of a DC/DC boost converter: Introducing EBEM-CE model., , and . EMC Compo, page 152-157. IEEE, (2013)