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Root cause identification of an hard-to-find on-chip power supply coupling fail.

, , , , , , и . ITC, стр. 1-7. IEEE Computer Society, (2012)

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Franco Kämmer

Franco Nüske

Franco Nüske

Franco Caldarone

Franco Lehmann

 

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High-Voltage and High-Power PLL Diagnostics using Advanced Cooling and Emission Images., , , , , , , и . ITC, стр. 1-10. IEEE Computer Society, (2006)Time-integrated photon emission as a function of temperature in 32 nm CMOS., , , , , , и . IRPS, стр. 2. IEEE, (2015)A Novel Scan Chain Diagnostics Technique Based on Light Emission from Leakage Current., , , и . ITC, стр. 140-147. IEEE Computer Society, (2004)A high sensitivity process variation sensor utilizing sub-threshold operation., , , , и . CICC, стр. 125-128. IEEE, (2008)MARVEL - Malicious alteration recognition and verification by emission of light., , , , , , , и . HOST, стр. 117-121. IEEE Computer Society, (2011)Innovate Practices on CyberSecurity of Hardware Semiconductor Devices., , , , , , , , , и 4 other автор(ы). VTS, стр. 1. IEEE, (2019)Optical and Electrical Testing of Latchup in I/O Interface Circuits., , , , , , , и . ITC, стр. 236-245. IEEE Computer Society, (2003)Optical Diagnostics for IBM POWER6- Microprocessor., , , , , , , , , и . ITC, стр. 1-9. IEEE Computer Society, (2008)Verification of untrusted chips using trusted layout and emission measurements., , , , , и . HOST, стр. 19-24. IEEE Computer Society, (2014)Estimating transistor channel temperature using time-resolved and time-integrated NIR emission., , , , , и . IRPS, стр. 6. IEEE, (2018)