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Root cause identification of an hard-to-find on-chip power supply coupling fail.

F. Stellari, T. Cowell, P. Song, M. Sorna, Z. Deniz, J. Bulzacchelli, and N. Mitra. ITC, page 1-7. IEEE Computer Society, (2012)

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Song Song

Peilin Zheng

Peilin Xian

Song-Hak Song-Schreff

Other publications of authors with the same name

Mapping of Oriental Migratory Locust Habitat Using Landsat OLI Images in Dongying City, China.X. Zheng, J. Huang, H. Li, L. Mansaray, P. Song, and Y. Dou. Agro-Geoinformatics, page 1-5. IEEE, (2018)Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling.R. Desplats, A. Eral, F. Beaudoin, P. Perdu, A. Weger, M. McManus, P. Song, and F. Stellari. Microelectron. Reliab., 43 (9-11): 1663-1668 (2003)Characterization of a 0.13 mum CMOS Link Chip using Time Resolved Emission (TRE).F. Stellari, P. Song, J. Hryckowian, O. Torreiter, S. Wilson, P. Wu, and A. Tosi. Microelectron. Reliab., 45 (9-11): 1550-1553 (2005)Estimating Urban Evapotranspiration at 10m Resolution Using Vegetation Information from Sentinel-2: A Case Study for the Beijing Sponge City.X. Zhang, and P. Song. Remote. Sens., 13 (11): 2048 (2021)Tester-based optical and electrical diagnostic system and techniques.P. Song, and F. Stellari. VTS, page 209-214. IEEE Computer Society, (2012)Latchup Analysis Using Emission Microscopy.F. Stellari, P. Song, M. McManus, A. Weger, R. Gauthier, K. Chatty, M. Muhammad, P. Sanda, P. Wu, and S. Wilson. Microelectron. Reliab., 43 (9-11): 1603-1608 (2003)Benchmarking at the Frontier of Hardware Security: Lessons from Logic Locking.B. Tan, R. Karri, N. Limaye, A. Sengupta, O. Sinanoglu, M. Rahman, S. Bhunia, D. Duvalsaint, R. Blanton, A. Rezaei and 25 other author(s). CoRR, (2020)Characterization of Random Process Variations Using Ultralow-Power, High-Sensitivity, Bias-Free Sub-Threshold Process Sensor.M. Meterelliyoz, P. Song, F. Stellari, J. Kulkarni, and K. Roy. IEEE Trans. Circuits Syst. I Regul. Pap., 57-I (8): 1838-1847 (2010)Reliability Study of 14 nm Scan Chains and Its Application to Hardware Security.F. Stellari, and P. Song. ITC, page 28-35. IEEE, (2022)On-chip power supply noise measurement using Time Resolved Emission (TRE) waveforms of Light Emission from Off-State Leakage Current (LEOSLC).F. Stellari, P. Song, J. Sylvestri, D. Miles, O. Forlenza, and D. Forlenza. ITC, page 1-10. IEEE Computer Society, (2009)

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Disambiguation of "Song, Peilin"

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Root cause identification of an hard-to-find on-chip power supply coupling fail.

Please choose a person to relate this publication to

Song Song

Song Song

Peilin Zheng

Peilin Xian

Song-Hak Song-Schreff

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Song, Peilin"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Root cause identification of an hard-to-find on-chip power supply coupling fail.

Please choose a person to relate this publication to

Song Song

Song Song

Peilin Zheng

Peilin Xian

Song-Hak Song-Schreff

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Root cause identification of an hard-to-find on-chip power supply coupling fail.