( en | de | ru )

 

Disambiguation of "Butler, Kenneth M."

Author of the publication

copydeleteadd this publication to your clipboard
So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment.

, , , , , and . ITC, page 1037-1038. IEEE Computer Society, (1997)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Kenneth M Dürsteler-MacFarland

Kenneth E M George

Erin Butler

Martin Butler

Marko Butler

 

Other publications of authors with the same name

What we know after twelve years developing and deploying test data analytics solutions., , and . ITC, page 1-8. IEEE, (2016)CATAPULT: Concurrent Automatic Testing Allowing Parallelization and Using Limited Topology., , , and . DAC, page 597-600. ACM, (1988)Modeling Test Escape Rate as a Function of Multiple Coverages., , and . ITC, page 1-9. IEEE Computer Society, (2008)Bayesian model fusion: Enabling test cost reduction of analog/RF circuits via wafer-level spatial variation modeling., , , , , and . ITC, page 1-10. IEEE Computer Society, (2014)Facilitating Rapid First Silicon Debug., , and . ITC, page 628-637. IEEE Computer Society, (2002)The roles of controllability and observability in design for test., , , and . VTS, page 211-216. IEEE Computer Society, (1992)Test Generation and Design for Test for a Large Multiprocessing DSP., , , and . ITC, page 149-156. IEEE Computer Society, (1995)Multidimensional Test Escape Rate Modeling., , , , and . IEEE Des. Test Comput., 26 (5): 74-82 (2009)Guest Editor's Introduction: ITC Helps Get More Out of Test.. IEEE Des. Test Comput., 23 (5): 388-389 (2006)Guest Editors' Introduction: IR Drop in Very Deep-Submicron Designs., and . IEEE Des. Test Comput., 24 (3): 214-215 (2007)