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Disambiguation of "Baeg, Sanghyeon"

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Logic soft error study with 800-MHz DDR3 SDRAMs in 3x nm using proton and neutron beams.

, , , , , , , and . IRPS, page 3. IEEE, (2015)

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Werner Baege

Otto-Richard Baege

Sang-Jin Baeg

Holm Baeger

Astrid Baege

 

Other publications of authors with the same name

Exploitations of Multiple Rows Hammering and Retention Time Interactions in DRAM Using X-Ray Radiation., , , , and . IEEE Access, (2021)Study of TID effects on one row hammering using gamma in DDR4 SDRAMs., , , and . IRPS, page 2-1. IEEE, (2018)Characterizing the Capacitive Crosstalk in SRAM Cells Using Negative Bit-Line Voltage Stress., , and . IEEE Trans. Instrumentation and Measurement, 61 (12): 3259-3272 (2012)Temporal and frequency characteristic analysis of margin-related failures caused by an intermittent nano-scale fracture of the solder ball in a BGA package device., , , and . Microelectron. Reliab., (2017)Low-Power Ternary Content-Addressable Memory Design Using a Segmented Match Line.. IEEE Trans. Circuits Syst. I Regul. Pap., 55-I (6): 1485-1494 (2008)A cost-effective design for testability: clock line control and test generation using selective clocking., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 18 (6): 850-861 (1999)Statistical distributions of row-hammering induced failures in DDR3 components., , and . Microelectron. Reliab., (2016)A di/dt Compensation Technique in Delay Testing by Disconnecting Power Pins.. IEEE Trans. Instrumentation and Measurement, 58 (10): 3450-3456 (2009)Null Detector Circuit Design Scheme for Detecting Defective AC-Coupled Capacitors in Differential Signaling.. IEEE Trans. Instrumentation and Measurement, 58 (8): 2544-2556 (2009)An Efficient Multiple Cell Upsets Tolerant Content-Addressable Memory., , , and . IEEE Trans. Computers, 63 (8): 2094-2098 (2014)