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Data Efficient Lithography Modeling With Transfer Learning and Active Data Selection., , , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 38 (10): 1900-1913 (2019)Manufacturability-aware mask assignment in multiple patterning lithography., , , , , and . APCCAS, page 538-541. IEEE, (2016)A Machine Learning Based Framework for Sub-Resolution Assist Feature Generation., , , , , and . ISPD, page 161-168. ACM, (2016)Data Efficient Lithography Modeling with Residual Neural Networks and Transfer Learning., , , , , , and . ISPD, page 82-89. ACM, (2018)Self-Aligned Double and Quadruple Patterning-aware grid routing with hotspots control., , , , , , , and . ASP-DAC, page 267-272. IEEE, (2013)Fast mask assignment using positive semidefinite relaxation in LELECUT triple patterning lithography., , , , , , and . ASP-DAC, page 665-670. IEEE, (2015)TEMPO: Fast Mask Topography Effect Modeling with Deep Learning., , , , , and . ISPD, page 127-134. ACM, (2020)Data Efficient Lithography Modeling with Transfer Learning and Active Data Selection., , , , , , and . CoRR, (2018)Subresolution Assist Feature Generation With Supervised Data Learning., , , , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 37 (6): 1225-1236 (2018)Optical lithography extension with double patterning.. ISPD, page 68. ACM, (2013)