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Bias Temperature Instability Reliability in Stacked Gate-All-Around Nanosheet Transistor.

M. Wang, J. Zhang, H. Zhou, R. Southwick, R. Chao, X. Miao, V. Basker, T. Yamashita, D. Guo, G. Karve, H. Bu, and J. Stathis. IRPS, page 1-6. IEEE, (2019)

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To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Zhang Zhang

Meng Zhang

Methods and implementations of road-network matchingM. Zhang. TU München, (2009)

Yan Zhang

Xianghong Zhang

Miao Zhang

Other publications of authors with the same name

Enhanced neighborhood node graph neural networks for load forecasting in smart grid.Y. Jiang, M. Liu, Y. Li, L. Yaping, J. Zhang, Y. Liu, and C. Liu. Int. J. Mach. Learn. Cybern., 15 (1): 129-148 (January 2024)A new technique for evaluating stacked nanosheet inner spacer TDDB reliability.T. Shen, K. Watanabe, H. Zhou, M. Belyansky, E. Stuckert, J. Zhang, A. Greene, V. Basker, and M. Wang. IRPS, page 1-5. IEEE, (2020)PCE-Palm: Palm Crease Energy Based Two-Stage Realistic Pseudo-Palmprint Generation.J. Jin, L. Shen, R. Zhang, C. Zhao, G. Jin, J. Zhang, S. Ding, Y. Zhao, and W. Jia. AAAI, page 2616-2624. AAAI Press, (2024)Real-time defog model based on visible and near-infrared information.J. Zhang, Y. Ding, Y. Yang, and J. Sun. ICME Workshops, page 1-6. IEEE Computer Society, (2016)Bias Temperature Instability Reliability in Stacked Gate-All-Around Nanosheet Transistor.M. Wang, J. Zhang, H. Zhou, R. Southwick, R. Chao, X. Miao, V. Basker, T. Yamashita, D. Guo, G. Karve and 2 other author(s). IRPS, page 1-6. IEEE, (2019)The Cross-disciplinary Psychological Distance Research: Especially from Business and Economics Perspectives.J. Zhang, X. He, X. Du, Y. Zhou, and J. Zhang. CSO, page 164-168. IEEE Computer Society, (2012)RPG-Palm: Realistic Pseudo-data Generation for Palmprint Recognition.L. Shen, J. Jin, R. Zhang, H. Li, K. Zhao, Y. Zhang, J. Zhang, S. Ding, Y. Zhao, and W. Jia. ICCV, page 19548-19559. IEEE, (2023)NetFPGA: Rapid Prototyping of Networking Devices in Open Source.N. Zilberman, Y. Audzevich, G. Kalogeridou, N. Bojan, J. Zhang, and A. Moore. SIGCOMM, page 363-364. ACM, (2015)SiGe Gate-All-around Nanosheet Reliability.H. Zhou, M. Wang, R. Bao, C. Durfee, L. Qin, and J. Zhang. IRPS, page 60-1. IEEE, (2022)FMM-Attack: A Flow-based Multi-modal Adversarial Attack on Video-based LLMs.J. Li, K. Gao, Y. Bai, J. Zhang, S. Xia, and Y. Wang. CoRR, (2024)

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Disambiguation of "Zhang, Jingyun"

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Bias Temperature Instability Reliability in Stacked Gate-All-Around Nanosheet Transistor.

Please choose a person to relate this publication to

Zhang Zhang

Meng Zhang

Yan Zhang

Xianghong Zhang

Miao Zhang

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Zhang, Jingyun"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Bias Temperature Instability Reliability in Stacked Gate-All-Around Nanosheet Transistor.

Please choose a person to relate this publication to

Zhang Zhang

Meng Zhang

Yan Zhang

Xianghong Zhang

Miao Zhang

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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Bias Temperature Instability Reliability in Stacked Gate-All-Around Nanosheet Transistor.