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Iddq Testing for High Performance CMOS - The Next Ten Years., , , , and . ED&TC, page 578-583. IEEE Computer Society, (1996)Design Of Ion-implanted MOSFET's with Very Small Physical Dimensions., , , , , and . Proc. IEEE, 87 (4): 668-678 (1999)Device scaling limits of Si MOSFETs and their application dependencies., , , , , and . Proc. IEEE, 89 (3): 259-288 (2001)Practical Strategies for Power-Efficient Computing Technologies., , , , , , , and . Proc. IEEE, 98 (2): 215-236 (2010)Challenges and future directions for the scaling of dynamic random-access memory (DRAM)., , , , , , and . IBM J. Res. Dev., 46 (2-3): 187-222 (2002)Silicon CMOS devices beyond scaling., , , , , , , , , and . IBM J. Res. Dev., 50 (4-5): 339-362 (2006)CMOS scaling for high performance and low power-the next ten years., , and . Proc. IEEE, 83 (4): 595-606 (1995)A novel dynamic memory cell with internal voltage gain., and . IEEE J. Solid State Circuits, 40 (4): 884-894 (2005)1-GHz fully pipelined 3.7-ns address access time 8 k×1024 embedded synchronous DRAM macro., , , , , , , , , and 2 other author(s). IEEE J. Solid State Circuits, 35 (11): 1673-1679 (2000)CMOS scaling in the 0.1-µm, 1.X-volt regime for high-performance applications., , , , , , , , , and 4 other author(s). IBM J. Res. Dev., 39 (1-2): 229-244 (1995)