Author of the publication

Early failure prediction by using in-situ monitors: Implementation and application results.

, , , and . ERMAVSS@DATE, volume 1566 of CEUR Workshop Proceedings, page 21-24. CEUR-WS.org, (2016)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Monitoring Setup and Hold Timing Limits., , and . IRPS, page 1-6. IEEE, (2021)Reliability analysis of MTJ-based functional module for neuromorphic computing., and . IOLTS, page 126-131. IEEE, (2017)Multi-context non-volatile content addressable memory using magnetic tunnel junctions., , , and . NANOARCH, page 103-108. ACM, (2016)Digital circuits reliability with in-situ monitors in 28nm fully depleted SOI., , , , , , , and . DATE, page 441-446. ACM, (2015)Hidden-Delay-Fault Sensor for Test, Reliability and Security., , , and . DATE, page 316-319. IEEE, (2019)Workload dependent reliability timing analysis flow., , , , , , and . DATE, page 736-737. IEEE, (2017)In-situ slack monitors: taking up the challenge of on-die monitoring of variability and reliability., , , , and . IVSW, page 1-5. IEEE, (2016)CNTFET Modeling and Reconfigurable Logic-Circuit Design., , , , , , , , , and 2 other author(s). IEEE Trans. Circuits Syst. I Regul. Pap., 54-I (11): 2365-2379 (2007)Leveraging Sparsity with Spiking Recurrent Neural Networks for Energy-Efficient Keyword Spotting., , , , and . ICASSP, page 1-5. IEEE, (2023)Evaluating the Impact of Aging on Path-Delay Self-Test Libraries., , , , and . DFT, page 1-7. IEEE, (2023)