( en | de | ru )

 

Disambiguation of "Vanhauwaert, Pierre"

Author of the publication

copydeleteadd this publication to your clipboard
Using multifunctional standardized stack as universal spintronic technology for IoT.

, , , , , , , , , , , , , , , , , and . DATE, page 931-936. IEEE, (2018)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Pierre Gottschlich

Pierre Mattern

Pierre Mangold

Pierre Nyabyenda

Pierre Rollin

 

Other publications of authors with the same name

Statistical fault injection: Quantified error and confidence., , , and . DATE, page 502-506. IEEE, (2009)IDSM: An improved disjoint signature monitoring scheme for processor behavioral checking., , and . LATW, page 1-6. IEEE, (2014)A Flexible SoPC-based Fault Injection Environment., , and . DDECS, page 192-197. IEEE Computer Society, (2006)Laser-induced fault effects in security-dedicated circuits., , , , , , , , , and 9 other author(s). VLSI-SoC, page 1-6. IEEE, (2014)Using multifunctional standardized stack as universal spintronic technology for IoT., , , , , , , , , and 8 other author(s). DATE, page 931-936. IEEE, (2018)Evaluation of Register-Level Protection Techniques for the Advanced Encryption Standard by Multi-Level Fault Injections., , and . DFT, page 499-507. IEEE Computer Society, (2007)Laser-Induced Fault Effects in Security-Dedicated Circuits., , , , , , , , , and 5 other author(s). VLSI-SoC (Selected Papers), volume 464 of IFIP Advances in Information and Communication Technology, page 220-240. Springer, (2014)A Novel Double-Data-Rate AES Architecture Resistant against Fault Injection., , and . FDTC, page 54-61. IEEE Computer Society, (2007)Evaluation of SET and SEU Effects at Multiple Abstraction Levels., , and . IOLTS, page 309-312. IEEE Computer Society, (2005)On error models for RTL security evaluations., , , , , and . DTIS, page 1-6. IEEE, (2014)