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Improving post-silicon error detection with topological selection of trace signals., , , , and . VLSI-SoC, page 1-6. IEEE, (2017)A Technique for Electrical Error Localization with Learning Methods During Post-silicon Debugging., , and . IGSC, page 1-8. IEEE, (2018)Black-Hat High-Level Synthesis: Myth or Reality?, , , and . IEEE Trans. Very Large Scale Integr. Syst., 27 (4): 913-926 (2019)Guest Editorial., , and . J. Electron. Test., 35 (5): 579-580 (2019)RATS: Restoration-Aware Trace Signal Selection for Post-Silicon Validation., and . IEEE Trans. Very Large Scale Integr. Syst., 21 (4): 605-613 (2013)Post-Silicon Gate-Level Error Localization With Effective and Combined Trace Signal Selection., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 39 (1): 248-261 (2020)RTL-ConTest: Concolic Testing on RTL for Detecting Security Vulnerabilities., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 41 (3): 466-477 (2022)Circuit Topology-Aware Vaccination-Based Hardware Trojan Detection., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 42 (9): 2852-2862 (September 2023)CAD-Base: An Attack Vector into the Electronics Supply Chain., , , , , , and . ACM Trans. Design Autom. Electr. Syst., 24 (4): 38:1-38:30 (2019)A Needle in the Haystack: Inspecting Circuit Layout to Identify Hardware Trojans., , and . IACR Cryptol. ePrint Arch., (2023)